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Volumn 634, Issue 1, 2011, Pages 8-46

The D0 silicon microstrip tracker

(134)  Ahmed, S N i   Angstadt, R u   Aoki, M u   Asman B k   Austin, S u   Bagby, L u   Barberis, E ac   Baringer, P z   Bean, A z   Bischoff, A r   Blekman, F i   Bolton, T A aa   Boswell, C r   Bowden, M u   Browning, F u   Buchholz, D x   Burdin, S u   Butler, D u   Cease, H u   Choi, S r   more..


Author keywords

Dzero; Run II; Silicon detector; Tevatron

Indexed keywords

DZERO; EXPERIMENT DATA; FERMILAB TEVATRON COLLIDER; MECHANICAL DESIGN; OPERATIONAL EXPERIENCE; RUN II; SILICON MICROSTRIP TRACKERS; TEVATRON;

EID: 79951954005     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.11.121     Document Type: Article
Times cited : (51)

References (27)
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  • 15
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    • Brush-Wellman, Cleveland, OH, USA.
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    • Ablefilm 563 K Ablestik, USA.
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    • The D0 SMT Production Testing Group, Electrical Production Testing of the D0 Silicon Microstrip Tracker Detector Modules, FERMILAB-TM-2348-E, 2006
    • The D0 SMT Production Testing Group, Electrical Production Testing of the D0 Silicon Microstrip Tracker Detector Modules, FERMILAB-TM-2348-E, 2006.
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    • LPC, Litchfield, MN, USA.
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    • Bassersdorf, Switzerland, URL
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    • Dyconex, A.G.1
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    • Compunetics Inc., Monroeville, PA, USA, URL
    • Compunetics Inc., Monroeville, PA, USA, URL: 〈 http://www. compunetics.com/ 〉.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.