Time- and wavelength-resolved luminescence evaluation of several types of scintillators using streak camera system equipped with pulsed X-ray source

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 634, Issue 1, 2011, Pages 59-63

  Furuya, Yuki ^a   Yanagida, Takayuki ^a   Fujimoto, Yutaka ^a   Yokota, Yuui ^a   Kamada, Kei ^a   Kawaguchi, Noriaki ^a,b   Ishizu, Sumito ^b   Uchiyama, Koro ^c   Mori, Kuniyoshi ^c   Kitano, Ken ^d   Nikl, Martin ^e   Yoshikawa, Akira ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b TOKUYAMA CORPORATION   (Japan)

^c CENTRAL RESEARCH LABORATORY   (Japan)

^d Vacuum and Optical Instruments   (Japan)

^e INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Pulsed X ray source; Scintillator; Streak camera system

Indexed keywords

EMISSION PROCESS; NEW SYSTEM; PICOSECONDS; PULSED X-RAY SOURCES; SCINTILLATION PROPERTIES; SCINTILLATOR; TRANSPARENT CERAMIC;

CAMERAS; ELECTRON SOURCES; IONIZATION; PHOSPHORS; SCINTILLATION; SCINTILLATION COUNTERS; STREAK CAMERAS; X RAY APPARATUS;

X RAYS;

EID: 79951952732     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.12.229     Document Type: Article

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