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Volumn , Issue , 2010, Pages 57-71

F007: Finding rediscovered faults from the field using function-level failed traces of software in the field

Author keywords

[No Author keywords available]

Indexed keywords

COARSE GRAINS; DEPLOYED SOFTWARE; FAULT PRONENESS; FINER GRAINS; SIEMENS; SYSTEM CODES;

EID: 79951891667     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1923947.1923954     Document Type: Conference Paper
Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.