Analytical evaluation of a reduced-pressure microwave-induced plasma studied by optical emission spectrometry method

Spectroscopy Letters

Volumn 44, Issue 2, 2011, Pages 128-137

  Matusiewicz, Henryk ^a   Slachcinski, Mariusz ^a  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Echelle spectrometer; elements' determination; reduced pressure microwave induced plasma; reference materials

Indexed keywords

EID: 79951867032     PISSN: 00387010     EISSN: 15322289     Source Type: Journal    
DOI: 10.1080/00387010.2010.481703     Document Type: Article

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