Virtualized ECC: Flexible reliability in main memory

IEEE Micro

Volumn 31, Issue 1, 2011, Pages 11-19

  Yoon, Doe Hyun ^a   Erez, Mattan ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

ECC; error checking and correcting; Error correction; fault tolerance; memory systems; reliability

Indexed keywords

CORRECTION MECHANISM; ECC; ERROR CHECKING AND CORRECTING; ERROR TOLERANCE; ERROR-CHECKING; MAIN MEMORY; MEMORY PROTECTION; MEMORY SYSTEMS; NAMESPACES; REDUNDANT INFORMATIONS;

FAULT TOLERANCE;

QUALITY ASSURANCE;

EID: 79951833652     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2010.103     Document Type: Article

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