Memory technology trend and future challenges

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2010, Pages

  Hong, Sungjoo ^a  

^a Hynix Semiconductor Inc   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FUTURE CHALLENGES; MEMORY TECHNOLOGY; NAND FLASH; RECENT PROGRESS; SEMICONDUCTOR MEMORY TECHNOLOGY; TECHNOLOGY SCALING;

DYNAMIC RANDOM ACCESS STORAGE; ELECTRON DEVICES; FLASH MEMORY; SEMICONDUCTOR STORAGE;

TECHNOLOGY;

EID: 79951831858     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2010.5703348     Document Type: Conference Paper

References (11)

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11. A. Driskill-Smith et al., IMW, 3-3.