Direct imaging and probing of the p-n junction in a planar polymer light-emitting electrochemical cell

Journal of the American Chemical Society

Volumn 133, Issue 7, 2011, Pages 2227-2231

  Hu, Yufeng ^a   Gao, Jun ^a  

^a QUEEN S UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTION TYPE; CURRENT-VOLTAGE MEASUREMENTS; DEVICE APPLICATION; DIRECT IMAGING; IMPURITIES IN; INTERELECTRODE GAPS; ORGANIC SEMICONDUCTOR; P-N JUNCTION; PLANAR POLYMERS; POTENTIAL DISTRIBUTIONS; SEMICONDUCTOR APPLICATIONS; SITE SELECTIVE;

CARRIER CONCENTRATION; CONJUGATED POLYMERS; ELECTROCHEMICAL CELLS; ELECTROLYTIC CELLS; ELECTRONIC STRUCTURE; IMPURITIES; ORGANIC POLYMERS; SEMICONDUCTOR DOPED POLYMERS;

SEMICONDUCTOR JUNCTIONS;

ALUMINUM; CONJUGATED POLYMER; GOLD; POLYMER; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; ELECTRODE; LIGHT EMITTING DIODE; SEMICONDUCTOR;

EID: 79951819909     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja1093106     Document Type: Article

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