Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

76th ARFTG Microwave Measurement Conference: Millimeter-Wave Measurements and Modeling, ARFTG 2010

Volumn , Issue , 2010, Pages

  Sakian, Pooyan ^a   Janssen, Erwin ^a   Essing, Jaap ^a   Mahmoudi, Reza ^a   Van Roermund, Arthur ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

60GHz; Differential; Measurement; mmwave; Noise figure; S parameter

Indexed keywords

60 GHZ CIRCUITS; 60GHZ; DELAY VARIATION; DIFFERENTIAL; DOUBLE-BALANCED; MEASUREMENT RESULTS; MM-WAVE; MM-WAVE FREQUENCIES; NETWORK ANALYZER; ON-WAFER; ON-WAFER MEASUREMENTS; RF PROBE; S PARAMETERS; S-PARAMETER MEASUREMENTS; WAVEGUIDE INTERFACES;

ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK ANALYZERS; MICROWAVE MEASUREMENT; MILLIMETER WAVE DEVICES; MILLIMETER WAVES; NOISE FIGURE; SCATTERING PARAMETERS;

MEASUREMENTS;

EID: 79951806671     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG76.2010.5700051     Document Type: Conference Paper

References (3)

1. P. Sakian, R. Mahmoudi, P. van Zeijl, M. Lont, and A. van Roermund, "A 60-GHz Double-Balanced Homodyne Down-Converter in 65-nm CMOS Process," 2009 European Microwave Integrated Circuits Conference, Rome, September 2009.
2. E. Janssen, R. Mahmoudi, E. van der Heijden, P. Sakian, A. de Graauw, R. Pijper, and A. van Roermund, "Fully Balanced 60 GHz LNA with 37% Bandwidth, 3.8 dB NF, 10dB Gain and Constant Group Delay over 6GHz Bandwidth," 2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, New Orleans, January 2010.
3. Noise Figure Measurement Accuracy- The Y-Factor Method, Agilent Application note 57-2, http://cp.literature.agilent.com/litweb/pdf/5952-3706E. pdf.