Max-clique: A top-down graph-based approach to frequent pattern mining

Proceedings - IEEE International Conference on Data Mining, ICDM

Volumn , Issue , 2010, Pages 1139-1144

  Xie, Yan ^a   Yu, Philip S ^a  

^a University of Illinois at Chicago   (United States)

Author keywords

Frequent pattern mining; Pattern graph; Top down

Indexed keywords

FREQUENT PATTERN MINING; FREQUENT PATTERNS; FUNDAMENTAL PROBLEM; GRAPH-BASED; GROWTH STRATEGY; LARGE DATABASE; MAXIMAL CLIQUE; MAXIMAL FREQUENT PATTERN; PATTERN GRAPH; STATE-OF-THE-ART ALGORITHMS; TOP-DOWN; TOP-DOWN MANNER;

DATA MINING;

EID: 79951764386     PISSN: 15504786     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDM.2010.73     Document Type: Conference Paper

References (4)

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