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Volumn 79, Issue 2, 2011, Pages 395-435

Efficient Tests Under a Weak Convergence Assumption

Author keywords

Robustness; Semiparametric efficiency; Unit root test

Indexed keywords


EID: 79951528446     PISSN: 00129682     EISSN: 14680262     Source Type: Journal    
DOI: 10.3982/ECTA7793     Document Type: Article
Times cited : (33)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.