Some metrics for accessing quality of product line architecture

Proceedings - International Conference on Computer Science and Software Engineering, CSSE 2008

Volumn 2, Issue , 2008, Pages 500-503

  Tao, Zhang ^a   Lei, Deng ^a   Jian, Wu ^a   Qiaoming, Zhou ^a   Chunyan, Ma ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

Architecture description language; Product line architecture; Software metrics; Variability

Indexed keywords

ARCHITECTURE DESCRIPTION LANGUAGES; CORE ASSET; PRODUCT LINE ARCHITECTURE; QUALITY OF PRODUCT; SOFTWARE METRICS; SOFTWARE PRODUCT LINE; VARIABILITY;

COMPUTER SCIENCE; COMPUTER SOFTWARE; QUALITY CONTROL; REUSABILITY;

SOFTWARE ARCHITECTURE;

EID: 79951482012     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CSSE.2008.500     Document Type: Conference Paper

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