Background-free detection of single 5 nm nanoparticles through interferometric cross-polarization microscopy

Nano Letters

Volumn 11, Issue 2, 2011, Pages 541-547

  Hong, Xin ^a,b   Van Dijk, Erik M P H ^c   Hall, Simon R ^a   Götte, Jörg B ^a   Van Hulst, Niek F ^d   Gersen, Henkjan ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b TIANJIN UNIVERSITY   (China)

^c UNIVERSITY OF TWENTE   (Netherlands)

^d ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

Author keywords

Background free detection; crossed polarizers; gold nanoparticles; heterodyne detection; interferometry; polarization microscopy

Indexed keywords

BACKGROUND-FREE DETECTION; CROSSED POLARIZERS; GOLD NANOPARTICLES; HETERODYNE DETECTION; POLARIZATION MICROSCOPY;

BIREFRINGENCE; HETERODYNING; INTERFEROMETRY; OPTICAL INSTRUMENTS; POLARIZATION; SIGNAL TO NOISE RATIO; TUNGSTEN;

NANOPARTICLES;

NANOMATERIAL;

ARTICLE; MATERIALS TESTING; METHODOLOGY; PHASE CONTRAST MICROSCOPY; POLARIZATION MICROSCOPY; ULTRASTRUCTURE;

MATERIALS TESTING; MICROSCOPY, INTERFERENCE; MICROSCOPY, POLARIZATION; NANOSTRUCTURES;

EID: 79851496280     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl1034489     Document Type: Article

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