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Russian Journal of Electrochemistry

Volumn 46, Issue 12, 2010, Pages 1383-1389

Diffusion layer thickness in a membrane system as determined from voltammetric and chronopotentiometric data

(6) Kozmai, A E a Nikonenko, V V a Pismenskaya, N D a Pryakhina, O D a Sistat, P b Pourcelly, G b

a KUBAN STATE UNIVERSITY (Russian Federation)

b UNIV MONTPELLIER (France)

Author keywords

chronopotentiometry; diffusion layer; ion exchange membrane; mathematical modeling; voltammetry

Indexed keywords

ACTIVE MEMBRANES; ANION EXCHANGE MEMBRANE; CHRONOPOTENTIOMETRY; CONVECTIVE DIFFUSION; COUNTERIONS; CURRENT VOLTAGE CURVE; DIFFUSION BOUNDARY-LAYERS; DIFFUSION LAYER; DIFFUSION LAYER THICKNESS; ELECTROCONVECTION; FLOW-THROUGH CELLS; HYDRODYNAMIC CONDITIONS; LEVEQUE EQUATION; LIMITING CURRENT DENSITY; LIMITING VALUES; MATHEMATICAL MODELING; MEMBRANE SURFACE; MEMBRANE SYSTEM; NACL SOLUTION; STOKES RADIUS; VOLTAMMETRIC;

COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC PROPERTIES; ION EXCHANGE; POSITIVE IONS; SODIUM CHLORIDE; SURFACE DIFFUSION; VOLTAMMETRY;

MEMBRANES;

EID: 79551708400 PISSN: 10231935 EISSN: 16083342 Source Type: Journal
DOI: 10.1134/S1023193510120074 Document Type: Article

Times cited : (23)

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