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Journal of Applied Physics

Volumn 109, Issue 2, 2011, Pages

Magnetic characterization of diluted magnetic semiconductor thin films

(6) Gu, Jian Jun a,b,c Liu, Li Hu a,b Qi, Yun Kai b,c Xu, Qin a,b Zhang, Hai Feng a,b Sun, Hui Yuan a,b

a HEBEI NORMAL UNIVERSITY (China)

b Key Laboratory of Advanced Films of Hebei Province (China)

c HEBEI NORMAL UNIVERSITY FOR NATIONALITIES (China)

Author keywords

[No Author keywords available]

Indexed keywords

AL-DOPED ZNO; BACKGROUND SIGNALS; COERCIVITIES; CORRECTION METHOD; DILUTED MAGNETIC SEMICONDUCTORS; FE-DOPED TIO; FITTING ERROR; GLASS SUBSTRATES; IMPROVED METHODS; MAGNETIC CHARACTERIZATION; ROOM TEMPERATURE FERROMAGNETISM; TIO;

CRYSTAL STRUCTURE; MAGNETIC MOMENTS; MAGNETIC SEMICONDUCTORS; SUBSTRATES; THIN FILMS; ZINC OXIDE;

FERROMAGNETISM;

EID: 79551675776 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3532043 Document Type: Article

Times cited : (29)

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