Dielectric, structural and Raman studies on (Na0.5Bi 0.5TiO3)(1-x)(BiCrO3)x ceramic

Journal of Physics Condensed Matter

Volumn 23, Issue 5, 2011, Pages

  Selvamani, Rachna ^a   Singh, Gurvinderjit ^a   Sathe, Vasant ^b   Tiwari, V S ^a   Gupta, P K ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

^b UGC   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COMPENSATION; DEFECT-RELATED BANDS; DIELECTRIC MEASUREMENTS; DIELECTRIC PERMITTIVITIES; FREQUENCY DEPENDENT; HIGHER TEMPERATURES; OXYGEN DEFECT; PHASE TRANSITION TEMPERATURES; RAMAN INVESTIGATIONS; RAMAN SPECTRA; RAMAN STUDIES; RELATIVE DIELECTRIC PERMITTIVITY; TILT ANGLE; TIO;

CRYSTAL STRUCTURE; DEFECTS; OXYGEN; PEROVSKITE; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SODIUM;

PERMITTIVITY;

EID: 79551667651     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/23/5/055901     Document Type: Article

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