Temperature distribution in a stack of intrinsic Josephson junctions with their CuO-plane electrodes oriented perpendicular to supporting substrate

Superconductor Science and Technology

Volumn 24, Issue 1, 2011, Pages

  Yurgens, A ^a   Bulaevskii, L N ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BATH TEMPERATURES; BI-2212; C-AXIS DIRECTION; ELECTRICAL CURRENT; INTERNAL TEMPERATURE; INTRINSIC JOSEPHSON JUNCTION; OUTPUT POWER; POWER DENSITIES; THZ EMISSION; THZ EMITTERS;

SINGLE CRYSTALS;

JOSEPHSON JUNCTION DEVICES;

EID: 79551589416     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/24/1/015003     Document Type: Article

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