Sub-nanosecond time-of-flight for segmented silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 632, Issue 1, 2011, Pages 133-136

  Desouza, R T ^a   Alexander, A ^a   Brown, K ^a   Floyd, B ^a   Gosser, Z Q ^a   Hudan, S ^a   Poehlman, J ^a   Rudolph, M J ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

Fast timing; Segmented silicon detectors; Silicon electronics; Time of flight

Indexed keywords

FAST TIMING; ION-IMPLANTED SILICON; LOW ENERGIES; MULTI-CHANNEL; NANOSECOND RESOLUTION; SEGMENTED SILICON DETECTOR; SEGMENTED SILICON DETECTORS; SILICON ELECTRONICS; TIME OF FLIGHT; TIME-OF-FLIGHT SYSTEM;

DETECTORS;

SILICON DETECTORS;

EID: 79551487003     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.12.101     Document Type: Article

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