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Volumn 6, Issue SUPPL. 2, 2009, Pages
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Epitaxial design of 475 nm InGaN laser diodes with reduced wavelength shift
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVE REGIONS;
ALGAN;
BARRIER MATERIAL;
CRYSTALLINE QUALITY;
DOUBLE QUANTUM WELL STRUCTURES;
GAN SUBSTRATE;
INDIUM CONTENT;
INGAN LASER DIODES;
LASER DIODES;
MATERIAL COMPOSITIONS;
QUANTUM WELL;
SINGLE QUANTUM WELL STRUCTURES;
SLOPE EFFICIENCIES;
WAVELENGTH SHIFT;
DEFECT DENSITY;
DEFECTS;
DIODES;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
INDIUM;
QUANTUM WELL LASERS;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR QUANTUM WELLS;
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EID: 79251617231
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200880783 Document Type: Article |
Times cited : (16)
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References (8)
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