Spectral properties and laser performance of Tm, Ho: LuLF4 crystal

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7276, Issue , 2009, Pages

  Peng, Haiyan ^a,b   Zhang, Kun ^a,b   Zhang, Lianhan ^a   Hang, Yin ^a   Xu, Jianqiu ^a   Tang, Yulong ^a   Cheng, Yan ^a,b   Xiong, Jing ^a,b  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

2 micron laser; Czochralski method; flat flat cavity; Tm,Ho:LuLF

Indexed keywords

2-MICRON LASER; ABSORPTION PEAKS; CO-DOPED; CONTINUOUS LASERS; CZOCHRALSKI METHODS; CZOCHRALSKI TECHNIQUE; END-PUMPED; FIBER-COUPLED LASER-DIODES; FLAT-FLAT CAVITY; LARGE SIZES; LASER PERFORMANCE; MEDIUM FREQUENCIES; OPTICAL QUALITIES; PUMPING WAVELENGTH; ROOM TEMPERATURE; SPECTRAL PROPERTIES; TM,HO:LULF;

ABSORPTION; ABSORPTION SPECTROSCOPY; HOLMIUM; PUMPING (LASER); THULIUM;

SINGLE CRYSTALS;

EID: 79251614072     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.823283     Document Type: Conference Paper

References (10)

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