Realization of effective light trapping and omnidirectional antireflection in smooth surface silicon nanowire arrays

Nanotechnology

Volumn 22, Issue 6, 2011, Pages

  Xie, W Q ^a   Oh, J I ^a,b   Shen, W Z ^a  

^a Laboratory of Condensed Matter Spectroscopy and Opto Electronic Physics   (China)

^b BOSTON COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-REFLECTION; AS-GROWN; CHEMICAL ETCHING TECHNIQUE; CRYSTALLINE SI; EXPERIMENTAL DATA; HIGH EFFICIENCY; LIGHT-TRAPPING; PER UNIT VOLUME; PHOTOCURRENT ENHANCEMENT; RIGOROUS COUPLED WAVE ANALYSIS; SILICON NANOWIRES; SIMULATION STUDIES; SMOOTH SURFACE; SOLAR SPECTRUM;

REFLECTION;

NANOWIRES;

EID: 79251543961     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/6/065704     Document Type: Article

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