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Volumn 83, Issue 1, 2011, Pages

Charge exchange and chemical reactions with trapped Th3+

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER GAS; CHARGE EXCHANGES; IMPURITIES IN; INTERNAL ELECTRONICS; ION TRAPS; LANGEVIN; LOSS RATES; MULTIPLY CHARGED IONS; ORDERS OF MAGNITUDE; TRAPPED ION;

EID: 79251520330     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.83.012710     Document Type: Article
Times cited : (16)

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