Growth mechanisms in SAPO-34 studied by white light interferometry and atomic force microscopy

Crystal Growth and Design

Volumn 10, Issue 7, 2010, Pages 2824-2828

  Holme, Børge ^a   Cubillas, Pablo ^b   Cavka, Jasmina Hafizovic ^a   Slater, Ben ^c   Anderson, Michael W ^b   Akporiaye, Duncan ^a  

^a SINTEF MATERIALS AND CHEMISTRY   (Norway)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

^c UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GEOMETRY; EFFICIENT METHOD; GROWTH MECHANISMS; SAPO-34; WHITE-LIGHT INTERFEROMETRY;

ATOMIC FORCE MICROSCOPY; CRYSTALS;

INTERFEROMETRY;

EID: 79251496090     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg9016118     Document Type: Article

References (43)

1. Wilson, S. T.; Lok, B. M.; Messina, C. A.; Cannan, T. R.; Flanigen, E. M. J. Am. Chem. Soc. 1982, 104, 1146-1147.
2. Lok, B. M.; Messina, C. A.; Patton, R. L.; Gajek, R. T.; Cannan, T. R.; Flanigen, E. M. J. Am. Chem. Soc. 1984, 106, 6092-6093.
3. Stöcker, M. Microporous Mesoporous Mater. 1999, 29, 3-48.
4. Marchi, A. J.; Froment, G. F. Appl. Catal. A: Gen. 1991, 71, 139-152.
5. Inui, T.; Matsuda, H.; Okaniwa, H.; Miyamoto, A. Appl. Catal. A: Gen. 1990, 58, 155-163.
6. Djieugoue, M.-A.; Prakash, A. M.; Kevan, L. J. Phys. Chem. B 2000, 104, 6452-6461.
7. Liang, J.; Li, H.; Zhao, S.; Guo, W.; Wang, R.; Ying, M. Appl. Catal. A: Gen. 1990, 64, 31-40.
8. Chen, D.; Rebo, H. P.; Grønvold, A.; Moljord, K.; Holmen, A. Microporous Mesoporous Mater. 2000, 121, 35-36.
9. Mees, F. D. P.;Martens,L.R.M.; Janssen,M. J. G.;Verberckmoes, A. A.; Vansant, E. F. Chem. Commun. 2003, 44-45.
10. Briend, M.; Vomscheid, R.; Peltre, M. J.; Man, P. P.; Barthomeuf, D. J. Phys. Chem. 1995, 99, 8270-8276.
11. Wei, Y.; Zhang, D.; He, Y.; Yang, Y.; Su, B.-L.; Liu, Z. Catal. Lett. 2007, 114 (1-2), 30-35.
12. Ashtekar, S.; Chilukuri, S. V. V.; Chakrabarty, D. K. J. Phys. Chem. 1994, 98, 4878-4883.
13. Dahl, I. M.; Wendelbo., R.; Andersen, A.; Akporiaye, D.; Mostad, H.; Fuglerud, T. Microporous Mesoporous Mater. 1999, 29, 159-171.
14. Yakubovich, O. V.; Massa, W.; Gavrilenko, P. G.; Pekov, I. V. Crystallogr. Rep. 2005, 50 (4), 544-553.
15. Breck, D. W. In Zeolite Molecular Sieves; John Wiley & Sons, Inc.: New York, 1974; pp 107-108.
16. Zhang, X.; Wang, R.; Yang, X.; Zhang, F. Microporous Mesoporous Mater. 2008, 116, 210-215.
17. Wei, Y.; Zhang, D.; Xu, L.; Chang, F.; He, Y.; Meng, S.; Su, B.; Liu, Z. Catal. Today 2008, 131, 262-269.
18. Binning, G.; Quate, C. F.; Gerber, Ch. Phys. Rev. Lett. 1986, 56, 930-933.
19. Yamamoto, S.; Sugiyama, S.; Matsuoka, O.; Honda, T.; Banno, Y.; Nozoye, H. Microporous Mesoporous Mater. 1998, 21, 1-6.
20. Sugiyama, S.; Yamamoto, S.; Matsuoka, O.; Nozoye, H.; Yu, J.; Zhu, G.; Qiu, S.; Terasaki, I. Microporous Mesoporous Mater. 1999, 28, 1-7.
21. Dumrul, S.; Bazzana, S.; Warzywoda, J.; Biederman, R. R.; Sacco, A., Jr. Microporous Mesoporous Mater. 2002, 54, 79-88.
22. Anderson, M. W.; Agger, J. R.; Meza, L. I.; Chong, C. B.; Cundy, C. S. Faraday Discuss. 2007, 136, 143-156.
23. Meza, L. I.; Anderson, M. W.; Slater, B.; Agger, J. R. Phys. Chem. Chem. Phys. 2008, 10, 5066-5076.
24. Singh, R.; Doolittle, J.; George, M. A.; Dutta, P. K. Langmuir 2002, 18, 8193-8197.
25. Meza, L. I.; Agger, J. R.; Logar, N. Z.; Kaucic, V.; Anderson, M. W. Chem. Commun. 2003, 2300-2301.
26. Warzywoda, J.; Yilmaz, B.; Miraglia, P. Q.; Sacco, A., Jr. Microporous Mesoporous Mater. 2004, 71, 177-183.
27. Cubillas, P.; Castro, M.; Jelfs, K. E.; Lobo, A. J. W.; Slater, B.; Lewis, D. W.; Wright, P. A.; Stevens, S. M.; Anderson, M. W. Cryst. Growth Des. 2009, 9, 4041-4050.
28. Shoaee, M.; Anderson, M. W.; Attfield, M. P. Angew. Chem., Int. Ed. 2008, 47, 8525-8528.
29. Arvidson, R. S.; Ertan, I. E.; Amonette, J. E.; Luttge, A. Geochim. Cosmochim. Acta 2003, 67 (9), 1623-1634.
30. Hammer, Ø.; Dysthe, D. K.; Lelu, B.; Lund, H.; Meakin, P.; Jamtveit, B. Geochim. Cosmochim. Acta 2008, 72, 5009-5021.
31. Kurganskaya, I.; Luttge, A.; Barron, A. Connexions, 2009-07-13, http://cnx.org/content/m22326/1.4/.
32. Caber, P. J. Appl. Opt. 1993, 32, 3438-2441.
33. Lamb, C.; Zecchino,M. In TheWYKOSurface Profilers Technical Reference Manual; Veeco Metrology Group: Tuscon, 1999; Chapter 1, pp 1-10.
34. Holme, B.; Hove, L.; Tveit, A. B. Measurement 2005, 38, 137-147.
35. Vistad, Ø. B.; Hansen, E. W.; Akporiaye, D. E.; Lillerud, K. P. J. Phys. Chem. A 1999, 103 (15), 2540-2552.
36. Burton, W. K.; Carbrera, N.; Frank, F. C. R. Soc. London Philos. Trans. A 1951, 243, 299-358.
37. Land, T. A.; De Yoreo, J. J. Cryst. Growth 2000, 208, 623-637.
38. Maiwa, K.; Plomp, M.; van Enckevort, W. J. P.; Bennema, P. J. Cryst. Growth 1998, 186, 214-223.
39. Teng, H. H.; Dove, P.; De Yoreo, J. Geochim. Cosmochim. Acta 2000, 64, 2255-2266.
40. Paquette, J.; Reeder, R. J. Geochim. Cosmochim. Acta 1995, 59, 735-749.
41. Chiu, J.; Slater, B.; Gale, J. D. Angew. Chem., Int. Ed. 2005, 44 (8), 1213-1217.
42. van Duin, A. C. T.; Strachan, A.; Stewman, S.; Zhang, Q. S.; Xu, X.; Goddard, W. A. J. Phys. Chem. A 2003, 107 (19), 3803-3811.
43. Gale, J. D.; Rohl, A. L. Mol. Simul. 2003, 29 (5), 291-341.