Sample-displacement correction for whole-pattern profile fitting of powder diffraction data collected in capillary geometry

Journal of Applied Crystallography

Volumn 44, Issue 1, 2011, Pages 60-64

  Scarlett, Nicola Vivienne Yorke ^a   Rowles, Matthew R ^a   Wallwork, Kia S ^b   Madsen, Ian C ^a  

^a CSIRO   (Australia)

^b AUSTRALIAN SYNCHROTRON   (Australia)

Author keywords

capillaries; crystallization; Debye Scherrer; in situ experiments; powder diffraction; sample displacement

Indexed keywords

CAPILLARIES; DEBYE-SCHERRER; IN-SITU EXPERIMENTS; POWDER DIFFRACTION; SAMPLE DISPLACEMENT;

CAPILLARITY; CRYSTALLIZATION; EXPERIMENTS; WALLS (STRUCTURAL PARTITIONS);

DIFFRACTION;

EID: 79251483813     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810047461     Document Type: Article

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