Observing deformations of 20 nanometer with a low-numerical-aperture light microscope

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2782, Issue , 2004, Pages 180-191

  Danuser, Gaudenz ^a   Mazza, Edoardo ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

image matching; self diagnostics; strain; super resolution

Indexed keywords

DIAGNOSTIC TOOLS; ELASTIC DOMAIN; GROUND TRUTH; IMAGE DATA; IMAGE PROCESSING ALGORITHM; IMAGE-MATCHING TECHNIQUE; LIGHT MICROSCOPES; MATCHING TECHNIQUES; MEASUREMENT ACCURACY; NANO-METER SCALE; NUMERICAL APERTURE; PARAMETER ESTIMATE; PHYSICAL ASPECTS; POST PROCESSING; RESOLUTION LIMITS; RIGID-BODY MOTION; SCANNING ELECTRON MICROSCOPE; SELF-DIAGNOSTICS; STATISTICAL TESTING; STRESS STRAIN RELATION; SUPER RESOLUTION; TENSILE TESTS;

ALGORITHMS; DEFORMATION; IMAGE PROCESSING; MEASUREMENT ERRORS; MEASUREMENTS; MICROMETERS; MICROSCOPES; OPTICAL DATA PROCESSING; OPTICAL TESTING; SCANNING ELECTRON MICROSCOPY; TENSILE TESTING;

IMAGE MATCHING;

EID: 78951496045     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.250744     Document Type: Conference Paper

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