Development of a TOF-SIMS technology as a predictive tool for the needs of the mineral processing industry

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 449-451

  Hart, Brian R ^a   Dimov, Stamen S ^a   Smart, Roger St C ^b  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

Author keywords

chemical reactivity test; flotation chemistry; mineral processing; surface copper quantification; TOF SIMS

Indexed keywords

CALIBRATION CURVES; DYNAMIC RANGE; EXPERIMENTAL DATA; FLOTATION BEHAVIOR; FLOWSHEET DEVELOPMENT; LOWER LIMITS OF DETECTIONS; MATRIX; MATRIX ELEMENTS; MINERAL FLOTATION; MINERAL PROCESSING; MINERAL PROCESSING INDUSTRY; MINERAL SURFACES; NORMALIZATION FACTORS; ORE MINERALS; PREDICTIVE TOOLS; RELATIVE SENSITIVITY FACTOR; SECONDARY ION YIELD; SEMI-QUANTITATIVE; SIGNAL INTENSITIES; SPECIMEN SURFACES; SURFACE CHARACTERIZATION; SURFACE LOADING; TEST PROTOCOLS; TIME-OF-FLIGHT SIMS; TOF SIMS;

BALL MILLS; CHEMICAL REACTIONS; CRYSTALLOGRAPHY; FLOTATION; LOADING; MINERAL INDUSTRY; MINERALOGY; ORE TREATMENT; ORES; SECONDARY ION MASS SPECTROMETRY; SILICATE MINERALS; TESTING;

MINERALS;

EID: 78951496015     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3447     Document Type: Conference Paper

References (4)

1. S. R. Rao, Surface Chemistry of Froth Flotation, Kulwer Academic/Plenum Publishers, New York, 2004, p 744.
2. R. St. C. Smart, J. Amarantidis, W. M. Skinner, C. A. Prestidge, L. LaVanier, S. G. Grano, Surface Analytical Studies of Oxidation and Collector Adsorption in Sulfide Mineral Flotation, in Solid-Liquid Interfaces (Eds:, K. Wandelt, S. Thurgate,), Topics in Applied Physics, Springer-Verlag, Berlin, 2003, 85, pp 3.
3. B. Hart, M. Biesinger, T. St. C. Smart, Improved statistical methods applied to surface chemistry in minerals flotation. Minerals Engineering, 2006, 19, 780.
4. R. St. C. Smart, B. R. Hart, M. C. Biesinger, J. T. Francis, T. Negeri, Surface Chemical Control in Sulfide Flotation: Principal Component Analysis of ToF-SIMS Data, Proc. XXIV International Minerals Processing Conference, (Eds:, D. Z. Wang, C. Y. Sun, F. L. Wang, L. C. Zhang, L. Han,) 2008, Beijing, China, September, ISBN 978-7-900249-54-8/TD 1 (Science Press: China), pp 1008.