SIMS depth profile analysis of particles collected in an urban environment

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 470-474

  Konarski, P ^a   Kaczorek, K ^a   Balcerzak, B ^b   Haluszka, J ^b   Scibor, M ^b   Iwanejko, I ^a   Zawada, A ^a  

^a TELE AND RADIO RESEARCH INSTITUTE   (Poland)

^b JAGIELLONIAN UNIVERSITY MEDICAL COLLEGE   (Poland)

Author keywords

core shell structures; depth profile analysis; induced sputum; particulate Matter; secondary ion mass spectrometry; urban environment particles

Indexed keywords

CORE SHELL STRUCTURE; DEPTH-PROFILE ANALYSIS; INDUCED SPUTUM; PARTICULATE MATTER; SECONDARY IONS; URBAN ENVIRONMENTS;

CHEMICAL ANALYSIS; INDIUM; IONS; METEOROLOGICAL INSTRUMENTS; QUARTZ; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; SUBSTRATES; URBAN PLANNING;

PARTICLES (PARTICULATE MATTER);

EID: 78951491406     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3666     Document Type: Conference Paper

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