Path dependence and the incumbent's survival in cross industries under radical circumstances: Lessons from the Samsung case

IEEE Transactions on Engineering Management

Volumn 58, Issue 1, 2011, Pages 154-164

  Park, Tae Young ^a  

^a Sogang University   (South Korea)

Author keywords

Display driver IC (DDI); incumbents; microprocessor; path dependence; radical circumstances; Samsung

Indexed keywords

DISPLAY DRIVER; INCUMBENTS; MICROPROCESSOR; PATH DEPENDENCE; RADICAL CIRCUMSTANCES; SAMSUNG;

CAPACITANCE; MICROPROCESSOR CHIPS;

INDUSTRY;

EID: 78951479425     PISSN: 00189391     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEM.2010.2048916     Document Type: Article

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