The development of SIMS and international SIMS conferences: A personal retrospective view

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 2-11

  Benninghoven, A ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

analytical application; history; instrumentation; secondary ion generation; SIMS conferences

Indexed keywords

ANALYTICAL APPLICATIONS; ANALYTICAL TECHNIQUES; APPLIED SURFACE; CLUSTER IONS; INSTRUMENTATION; ION YIELDS; SECONDARY ION GENERATION; SECONDARY IONS; SIMS CONFERENCES; SOLID MATERIAL; SPECIAL OPERATIONS; STRONG INTERACTION; THIN LAYERS;

INSTRUMENTS; LUNAR SURFACE ANALYSIS; MASS SPECTROMETRY; SECONDARY EMISSION; SURFACE ANALYSIS;

IONS;

EID: 78951477801     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3688     Document Type: Conference Paper

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