ToF-SIMS imaging of surface self-organized fractal patterns of bacteria

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 370-375

  Tuccitto, N ^a   Marletta, G ^a   Carnazza, S ^b   Grasso, L ^b   Caratozzolo, M ^b   Guglielmino, S ^b   Licciardello, A ^a  

^a UNIVERSITY OF CATANIA   (Italy)

^b UNIVERSITY OF MESSINA   (Italy)

Author keywords

bacteria; electrostatic interactions; fractal pattern; imaging; ToF SIMS

Indexed keywords

ALKALI ION; CHEMICAL MAPS; ELECTROSTATIC INTERACTIONS; FRACTAL PATTERN; FRACTAL PATTERNS; IMAGING; IONIC FLUXES; ORGANIC FRAGMENTS; SELF-ORGANIZATIONS; SELF-ORGANIZED; STAPHYLOCOCCUS EPIDERMIDIS; SURFACE ORGANIZATION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; TOF-SIMS IMAGING;

ADHESION; ALKALINITY; CELL ADHESION; CELL MEMBRANES; ELECTROSTATICS; FRACTALS; SECONDARY ION MASS SPECTROMETRY; SILICON COMPOUNDS; SILICON OXIDES;

BACTERIOLOGY;

EID: 78951476492     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3555     Document Type: Conference Paper

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