Raman instrumentation for confocal Raman microscopy

Springer Series in Optical Sciences

Volumn 158, Issue , 2010, Pages 43-60

  Hollricher, Olaf ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78951473178     PISSN: 03424111     EISSN: 15561534     Source Type: Book Series    
DOI: 10.1007/978-3-642-12522-5_3     Document Type: Article

References (8)

1. C. Raman, Indian J. Phys. 2, 387 (1928)
2. T. Maiman. U.S. Patent 3,353,115, 13 Apr 1961
3. W. Boyle, G. Smith, Bell Syst. Tech. J. 49, 587 (1970)
4. S. Sze, Physics of Semiconductor Devices, (John Wiley & Sons, New York, Chichester, Brisbane, Toronto, Singapore, 1981), p. 407
5. I. R. Lewis, H.G.M. Edwards (eds.), Handbook of Raman Spectroscopy (Dekker, New York, Basel 2001)
6. T. Dieing, O. Hollricher, Vib. Spectrosc. 48, 22 (2008)
7. U. Schmidt, S. Hild, O. Hollricher, Macromol. Symp. 230, 133 (2005)
8. U. Schmidt, W. Ibach, J. Mueller, O. Hollricher, SPIE Proc. 6616(1), 66160E (2007)