SIMS analytical technique for PV applications

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 643-645

  Peres, P ^a   Merkulov, A ^a   Desse, F ^a   Schuhmacher, M ^a  

^a CAMECA   (United States)

Author keywords

photovoltaic structures; pure material; SIMS

Indexed keywords

ANALYTICAL PERFORMANCE; ANALYTICAL TECHNIQUES; CIGS THIN FILMS; DETECTION LIMITS; LIGHT ELEMENTS; MAIN COMPONENT; PHOTOVOLTAIC STRUCTURES; PURE MATERIALS; SI DOPANT; SIMS; TRACE ELEMENT ANALYSIS;

PHOTOVOLTAIC EFFECTS; TRACE ELEMENTS;

TRACE ANALYSIS;

EID: 78951471274     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3525     Document Type: Conference Paper

References (5)

1. A. Bogaerts, R. Gijbels, Fresenius J. Anal. Chem. 1999, 364, 367.
2. SEMI, 2008, Doc. 4558A.
3. K. Graff, Analysis of Microelectronic Materials and Devices, John Wiley & Sons, Chichester, UK, 1991, pp. 77.
4. K. T. F. Janssen, Analysis of Microelectronic Materials and Devices, John Wiley & Sons, Chichester, UK, 1991, pp. 407.
5. th Photodetector materials and devices Conference, San Jose, CA, 2002, p. 229.