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Volumn 111, Issue 1, 2011, Pages 6-9

How to measure patent thickets-A novel approach

Author keywords

Complexity; Patent portfolio races; Patent thickets; Patenting

Indexed keywords


EID: 78751649972     PISSN: 01651765     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.econlet.2010.12.005     Document Type: Article
Times cited : (73)

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  • 18
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.