Controlling nanoslot overlimiting current with the depth of a connecting microchamber

EPL

Volumn 90, Issue 6, 2010, Pages

  Yossifon, G ^a   Mushenheim, P ^b   Chang, H C ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b University of Notre Dame   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78751649651     PISSN: 02955075     EISSN: 12864854     Source Type: Journal    
DOI: 10.1209/0295-5075/90/64004     Document Type: Article

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