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Volumn 357, Issue 2, 2011, Pages 404-410
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The defect diffusion model, scaling, EV*/H* and monomer volume and correlation lengths for glass-formers
a
BSC Inc
(United States)
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Author keywords
Correlation length; Dielectric relaxation; High pressure; Scaling
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Indexed keywords
ACTIVATION ENTHALPIES;
BONDED MATERIALS;
CORRELATION LENGTHS;
CRITICAL TEMPERATURES;
DEFECT DIFFUSION;
DYNAMICAL CORRELATIONS;
GLASSFORMERS;
HIGH PRESSURE;
NATURAL CONSEQUENCES;
POWER LAW;
SCALING;
SOLID STATE NMR;
ACTIVATION ENERGY;
DEFECTS;
DIELECTRIC RELAXATION;
MONOMERS;
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;
SOIL STRUCTURE INTERACTIONS;
CORRELATION METHODS;
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EID: 78751634459
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2010.07.031 Document Type: Conference Paper |
Times cited : (2)
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References (39)
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