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Volumn 357, Issue 2, 2011, Pages 404-410

The defect diffusion model, scaling, EV*/H* and monomer volume and correlation lengths for glass-formers

Author keywords

Correlation length; Dielectric relaxation; High pressure; Scaling

Indexed keywords

ACTIVATION ENTHALPIES; BONDED MATERIALS; CORRELATION LENGTHS; CRITICAL TEMPERATURES; DEFECT DIFFUSION; DYNAMICAL CORRELATIONS; GLASSFORMERS; HIGH PRESSURE; NATURAL CONSEQUENCES; POWER LAW; SCALING; SOLID STATE NMR;

EID: 78751634459     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2010.07.031     Document Type: Conference Paper
Times cited : (2)

References (39)
  • 6
    • 40449113532 scopus 로고    scopus 로고
    • 5th International Workshop on Complex Systems
    • J.T. Bendler, J.J. Fontanella, and M.F. Shlesinger M. Tokuyama, I. Oppenheim, H. Nishiyama, 5th International Workshop on Complex Systems AIP Conference Proceedings Volume 982 2008 American Institute of Physics New York 215 218
    • (2008) AIP Conference Proceedings , vol.982 , pp. 215-218
    • Bendler, J.T.1    Fontanella, J.J.2    Shlesinger, M.F.3
  • 37
    • 29744443730 scopus 로고
    • Equation (6) was best-fit to the dielectric relaxation data over the temperature range 260 K to 276 K
    • G.P. Johari, and M. Goldstein Equation (6) was best-fit to the dielectric relaxation data over the temperature range 260 K to 276 K J. Chem. Phys. 53 1970 2372
    • (1970) J. Chem. Phys. , vol.53 , pp. 2372
    • Johari, G.P.1    Goldstein, M.2
  • 39
    • 77649190575 scopus 로고
    • Equation (6) was best-fit over the temperature range 259 to 271 K
    • M. Naoki, H. Endou, and K. Matsumoto Equation (6) was best-fit over the temperature range 259 to 271 K J. Phys. Chem. 91 1987 4069
    • (1987) J. Phys. Chem. , vol.91 , pp. 4069
    • Naoki, M.1    Endou, H.2    Matsumoto, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.