Application of thin-film contact-free magneto-elastic sensors and stochastic nonlinear modeling to system damage diagnosis

Science of Advanced Materials

Volumn 2, Issue 2, 2010, Pages 230-238

  Dimogianopoulos, Dimitrios G ^a,b   Mouzakis, Dionysios E ^c  

^a UNIVERSITY OF PATRAS   (Greece)

^b UNIVERSITY OF WEST ATTICA   (Greece)

^c NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

Author keywords

Contact free measurements; Damage diagnosis; Hypothesis testing; Magnetoelastic sensors; Nonlinear modeling; Statistical decision making; Stochastic systems

Indexed keywords

EID: 78751570972     PISSN: 19472935     EISSN: 19472943     Source Type: Journal    
DOI: 10.1166/sam.2010.1091     Document Type: Article

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