|
Volumn 34, Issue 11, 2010, Pages 1729-1732
|
236U AMS measurement at CIRCE
|
Author keywords
AMS; Beam emittance; Sensitivity; Uranium
|
Indexed keywords
|
EID: 78751504463
PISSN: 16741137
EISSN: None
Source Type: Journal
DOI: 10.1088/1674-1137/34/11/012 Document Type: Article |
Times cited : (19)
|
References (12)
|