On sampled-data models for model predictive control

IECON Proceedings (Industrial Electronics Conference)

Volumn , Issue , 2010, Pages 2966-2971

  Silva, César A ^a   Yuz, Juan I ^a  

^a DEPARTAMENTO DE FÍSICA   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

DISCRETIZATIONS; EULER APPROXIMATION; KEY ISSUES; MODEL ACCURACY; MODEL COMPLEXITY; NON-LINEARITY; RELATIVE DEGREES; SAMPLED DATA MODELS; TAYLOR SERIES EXPANSIONS; TIME VARYING PARAMETER;

INDUSTRIAL ELECTRONICS; MODELS; POWER ELECTRONICS; PREDICTIVE CONTROL SYSTEMS; TAYLOR SERIES;

MODEL PREDICTIVE CONTROL;

EID: 78751470009     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2010.5674939     Document Type: Conference Paper

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