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Volumn 42, Issue 11, 2010, Pages 13-17
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Characterizing nanometer-scale materials using a low-angle backscattered electron detector
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Author keywords
[No Author keywords available]
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Indexed keywords
BACKSCATTERED ELECTRONS;
COATED FIBERS;
COMPOSITIONAL IMAGING;
COMPOSITIONAL MAPS;
FIELD EMISSION SCANNING ELECTRON MICROSCOPES;
LATEST DEVELOPMENT;
NANO-METER-SCALE;
QUANTITATIVE ANALYSIS;
SECONDARY ELECTRON IMAGES;
SECONDARY ELECTRON IMAGING;
SPATIAL RESOLUTION;
VISUALIZATION TECHNOLOGIES;
BACKSCATTERING;
DETECTORS;
ELECTRON BEAMS;
ELECTRON OPTICS;
ELECTRON SCATTERING;
FIELD EMISSION;
SCANNING ELECTRON MICROSCOPY;
SECONDARY EMISSION;
VISUALIZATION;
ELECTRONS;
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EID: 78651490493
PISSN: 00447749
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (7)
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References (8)
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