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Volumn 83, Issue 1, 2011, Pages

Sample-to-sample fluctuations of electrostatic forces generated by quenched charge disorder

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE DISORDER; CHARGED SURFACES; ELECTROSTATIC INTERACTIONS; EXPERIMENTAL SYSTEM; LATERAL FORCE; LONG RANGE; MEAN VALUES; NORMAL FORCES; PLANE GEOMETRY; PROXIMITY FORCE APPROXIMATION; QUENCHED CHARGE DISORDER; SAMPLE-TO-SAMPLE FLUCTUATIONS; SCALING BEHAVIOR;

EID: 78651444451     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.83.011102     Document Type: Article
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.