On the optimal frame-length configuration on real passive RFID systems

Journal of Network and Computer Applications

Volumn 34, Issue 3, 2011, Pages 864-876

  Bueno Delgado, M V ^a   Vales Alonso, J ^a  

^a TECHNICAL UNIVERSITY OF CARTAGENA   (Spain)

Author keywords

Capture effect; EPCglobal Class 1 Gen 2; FSA; Markov chain; RFID

Indexed keywords

CAPTURE EFFECT; EPCGLOBAL CLASS-1 GEN-2; FSA; MARKOV CHAIN; RFID;

CRYPTOGRAPHY; MARKOV PROCESSES; OPTIMIZATION;

RADIO FREQUENCY IDENTIFICATION (RFID);

EID: 78651371232     PISSN: 10848045     EISSN: 10958592     Source Type: Journal    
DOI: 10.1016/j.jnca.2010.04.022     Document Type: Article

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