Characterization of RuO2 nanocrystals deposited on carbon nanotubes by reactive sputtering

Journal of Alloys and Compounds

Volumn 509, Issue 5, 2011, Pages 2011-2015

  Su, Y C ^a   Chen, C A ^a   Chen, Y M ^a   Huang, Y S ^a   Lee, K Y ^a   Tiong, K K ^b  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

Author keywords

Nanostructured materials; Oxide materials; Raman scattering; RF magnetron sputtering; Scanning electron microscopy; Transmission electron microscopy; X ray photoelectron spectroscopy

Indexed keywords

FIELD EMISSION SCANNING ELECTRON MICROSCOPY; OXIDATION STATE; OXIDE MATERIALS; OXYGEN FLUXES; PEAK POSITION; RAMAN FEATURE; REACTIVE RADIO-FREQUENCY MAGNETRON SPUTTERING; RESIDUAL STRESS EFFECTS; RF-MAGNETRON SPUTTERING; SCANNING ELECTRONS; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPY IMAGES; TUBE-LIKE; X-RAY PHOTOELECTRON SPECTROSCOPY SPECTRA;

CARBON NANOTUBES; DIFFRACTION; ELECTRON TUBES; ELECTRONS; MAGNETRON SPUTTERING; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; OXIDE MINERALS; OXYGEN; PHOTOELECTRICITY; PHOTONS; RAMAN SCATTERING; RUTHENIUM; RUTHENIUM ALLOYS; RUTHENIUM COMPOUNDS; SCANNING; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 78651357945     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.10.121     Document Type: Article

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