Energy level alignment, electron injection, and charge recombination characteristics in CdS/CdSe cosensitized TiO2 photoelectrode

Applied Physics Letters

Volumn 98, Issue 1, 2011, Pages

  Chi, Ching Fa ^a   Cho, Hsun Wei ^a   Teng, Hsisheng ^a   Chuang, Cho Ying ^b   Chang, Yu Ming ^b   Hsu, Yao Jane ^c   Lee, Yuh Lang ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND EDGE; CDS; CHARGE RECOMBINATIONS; ENERGY LEVEL; ENERGY LEVEL ALIGNMENT; INJECTION EFFICIENCY; OPEN-CIRCUIT PHOTOVOLTAGE; PHOTOELECTRODE; PHOTOGENERATED ELECTRONS; RECOMBINATION RATE; TIME-RESOLVED PHOTOLUMINESCENCE; TIO;

ALIGNMENT; CADMIUM ALLOYS; CADMIUM SULFIDE; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

CADMIUM COMPOUNDS;

EID: 78651315753     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3533642     Document Type: Article

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