|
Volumn 91, Issue 2, 2011, Pages 86-96
|
Activation energy for long-range migration of self-interstitial atoms in tungsten obtained by direct measurement of radiation-induced point-defect clusters
|
Author keywords
migration; self interstitial atom; tungsten
|
Indexed keywords
ANNEALING TEMPERATURES;
DIRECT MEASUREMENT;
ENERGETIC PARTICLES;
EXPERIMENTAL DATA;
HIGH VOLTAGE ELECTRON MICROSCOPY;
HIGH-ENERGY ELECTRON IRRADIATION;
IRRADIATION TEMPERATURE;
LOW TEMPERATURES;
MIGRATION;
NUMBER DENSITY;
PHYSICAL QUANTITIES;
POINT-DEFECT CLUSTERS;
RADIATION-INDUCED;
RANGE MIGRATION;
SELF-INTERSTITIAL ATOMS;
SIA CLUSTER;
SYSTEMATIC STUDY;
THEORETICAL STUDY;
THERMAL-ANNEALING;
ACTIVATION ENERGY;
ATOMS;
ELECTRON IRRADIATION;
METAL ANALYSIS;
METAL RECOVERY;
TUNGSTEN;
EXPERIMENTS;
|
EID: 78651276313
PISSN: 09500839
EISSN: 13623036
Source Type: Journal
DOI: 10.1080/09500839.2010.533133 Document Type: Article |
Times cited : (30)
|
References (33)
|