Hydrogen-vanadium system in thin films: Effect of film thickness

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 24, 2010, Pages

  Bloch, J ^a,b   Pejova, B ^a,c   Jacob, J ^a   Hjorvarsson B ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b NUCLEAR RESEARCH CENTER NEGEV   (Israel)

^c SS CYRIL AND METHODIUS UNIVERSITY   (Macedonia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78651270039     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.245428     Document Type: Article

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