NiO-like single layer formed on a Ni/Cu(001) thin film revealed by the depth-resolved x-ray absorption spectroscopy

Applied Physics Letters

Volumn 98, Issue 1, 2011, Pages

  Amemiya, Kenta ^a   Sakamaki, Masako ^a  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH-RESOLVED; FERROMAGNETIC AND ANTI-FERROMAGNETIC; NI FILMS; NI ULTRATHIN FILMS; SHARP INTERFACE; SINGLE LAYER; SPIN MOMENTS; SURFACE LAYERS; UNDERLYING LAYERS; X-RAY ABSORPTION SPECTRUM;

ABSORPTION; ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; COPPER; MAGNETIC PROPERTIES; OXYGEN; ULTRATHIN FILMS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAYS;

ABSORPTION SPECTROSCOPY;

EID: 78651267650     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3531668     Document Type: Article

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