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Volumn 605, Issue 3-4, 2011, Pages 314-320

Characterization and stability of thin oxide films on plutonium surfaces

Author keywords

AES; Oxidation; Plutonium; XPS

Indexed keywords

AES; AUTOREDUCTION; METAL OXIDE INTERFACE; METAL SURFACES; NEAR SURFACE REGIONS; OXIDATION STATE; PLUTONIUM DIOXIDE; PLUTONIUM METAL; PLUTONIUM OXIDE; PLUTONIUM SURFACES; RELATIVE CONCENTRATION; THIN OXIDE FILMS; XPS;

EID: 78651253542     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2010.10.034     Document Type: Article
Times cited : (57)

References (27)
  • 10
    • 78651229050 scopus 로고    scopus 로고
    • ANSYS, Inc., Southpointe, 275 Technology Dr., Canonsburg, PA 15317 USA
    • ANSYS, Inc., Southpointe, 275 Technology Dr., Canonsburg, PA 15317 USA.
  • 11
    • 78651226328 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Wales, Cardiff
    • S. Tull, 2003 Ph.D. Thesis, University of Wales, Cardiff.
    • (2003)
    • Tull, S.1
  • 17
    • 85027719042 scopus 로고    scopus 로고
    • Casa Software LTD., Bay House, 5 Grosvenor Terrace, Teignmouth, Devon TQ14 8NE, UK
    • N. Fairley, CasaXPS®, Casa Software LTD., Bay House, 5 Grosvenor Terrace, Teignmouth, Devon TQ14 8NE, UK.
    • CasaXPS®
    • Fairley, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.