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Volumn 605, Issue 3-4, 2011, Pages 314-320
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Characterization and stability of thin oxide films on plutonium surfaces
c
AWE
(United Kingdom)
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Author keywords
AES; Oxidation; Plutonium; XPS
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Indexed keywords
AES;
AUTOREDUCTION;
METAL OXIDE INTERFACE;
METAL SURFACES;
NEAR SURFACE REGIONS;
OXIDATION STATE;
PLUTONIUM DIOXIDE;
PLUTONIUM METAL;
PLUTONIUM OXIDE;
PLUTONIUM SURFACES;
RELATIVE CONCENTRATION;
THIN OXIDE FILMS;
XPS;
AUGER ELECTRON SPECTROSCOPY;
OXIDATION;
OXYGEN;
PLUTONIUM;
PLUTONIUM COMPOUNDS;
STOICHIOMETRY;
X RAY PHOTOELECTRON SPECTROSCOPY;
OXIDE FILMS;
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EID: 78651253542
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2010.10.034 Document Type: Article |
Times cited : (57)
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References (27)
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