Source camera identification from significant noise residual regions

Proceedings - International Conference on Image Processing, ICIP

Volumn , Issue , 2010, Pages 1749-1752

  Liu, Bei Bei ^a,b   Hu, Yongjian ^b   Lee, Heung Kyu ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b SOUTH CHINA UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Digital forensics; Photo response non uniformity; Sensor pattern noise; Source camera identification

Indexed keywords

BINARY HYPOTHESIS TESTING; DIGITAL FORENSIC; FALSE REJECTION RATE; NONUNIFORMITY; PHOTORESPONSES; SIGNAL QUALITY; SOURCE CAMERA IDENTIFICATION;

ALGORITHMS; CAMERAS; COMPUTER CRIME; ELECTRONIC CRIME COUNTERMEASURES; IMAGE PROCESSING; IMAGING SYSTEMS; SENSORS;

COMPUTER GRAPHICS;

EID: 78651097240     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2010.5652426     Document Type: Conference Paper

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