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Journal of Crystal Growth

Volumn 314, Issue 1, 2011, Pages 370-373

Role of oxygen in structural properties of annealed CuAlO2 films

(8) Lan, W a Pan, J Q a Zhu, C Q a Wang, G Q a Su, Q a Liu, X Q a Xie, E Q a Yan, H b

a LANZHOU UNIVERSITY (China)

b BEIJING UNIVERSITY OF TECHNOLOGY (China)

Author keywords

A1. oxygen concentration; A1. structural properties; A1. X ray diffraction; B1. CuAlO2 films

Indexed keywords

A1. STRUCTURAL PROPERTIES; AMORPHOUS STATE; B1. CUALO2 FILMS; ELECTRICAL RESISTIVITY; EXCESS OXYGEN; FILM SURFACES; NEGATIVE THERMAL EXPANSION BEHAVIORS; OXYGEN CONCENTRATIONS; OXYGEN PARTIAL PRESSURE; PREFERENTIAL ORIENTATION; QUARTZ SUBSTRATE;

AMORPHOUS FILMS; ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CRYSTALLINE MATERIALS; DIFFRACTION; ELECTRIC CONDUCTIVITY; OXYGEN; QUARTZ; RAMAN SPECTROSCOPY; THERMAL EXPANSION; X RAY DIFFRACTION; X RAYS;

STRUCTURAL PROPERTIES;

EID: 78651089418 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2010.11.172 Document Type: Article

Times cited : (21)

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