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Volumn 241, Issue , 2010, Pages
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TEM investigation of MgO thin films for magnetic tunnel junction application
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Author keywords
[No Author keywords available]
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Indexed keywords
COBALT COMPOUNDS;
CRYSTALLINE MATERIALS;
DEPOSITION;
ELECTRON ENERGY LEVELS;
ELECTRON SCATTERING;
ENERGY DISSIPATION;
MAGNESIA;
MAGNETIC DEVICES;
OXIDE FILMS;
THIN FILMS;
TUNNEL JUNCTIONS;
COMPOSITION ANALYSIS;
CROSS-SECTIONAL TEM;
ENERGY DISPERSIVE X-RAY;
INHOMOGENEOUS OXIDES;
INITIAL DEPOSITIONS;
MAGNETIC TUNNEL JUNCTION;
SPUTTERING PARAMETERS;
TARGET TO SUBSTRATE DISTANCE;
ELECTRON ENERGY LOSS SPECTROSCOPY;
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EID: 78651080882
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/241/1/012039 Document Type: Conference Paper |
Times cited : (14)
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References (6)
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