E-spline sampling for precise and robust line-edge extraction

Proceedings - International Conference on Image Processing, ICIP

Volumn , Issue , 2010, Pages 909-912

  Hirabayashi, Akira ^a   Dragotti, Pier Luigi ^b  

^a YAMAGUCHI UNIVERSITY   (Japan)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

E spline functions; Finite rate of innovation signals; Hough transform; Line edge

Indexed keywords

B SPLINE FUNCTIONS; EDGE EXTRACTION; FINITE RATE; LINE-EDGE; PIXEL VALUES; SIMULATION RESULT; SPLINE FUNCTIONS; STANDARD DEVIATION; SUB PIXELS;

HOUGH TRANSFORMS; IMAGE PROCESSING; IMAGING SYSTEMS; INTERPOLATION; MATHEMATICAL TRANSFORMATIONS; PIXELS; SIGNAL RECONSTRUCTION;

SPLINES;

EID: 78651062886     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2010.5652292     Document Type: Conference Paper

References (6)

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2. P.V.C. Hough, "Method and means for recognizing complex patterns," U.S. Patent 3069654, 1962.
3. L. Baboulaz and P.L. Dragotti, "Exact feature extraction using finite rate of innovation principles with an application to image super-resolution," IEEE Trans. Image Processing, vol. 18, no. 2, pp. 281-298, Feb. 2009.
4. M. Vetterli, P. Marziliano, and T. Blu, "Sampling signals with finite rate of innovation," IEEE Trans. Signal Processing, vol. 50, no. 6, pp. 1417-1428, June 2002.
5. M. Unser and T. Blu, "Cardinal exponential splines: Part I-Theory and filtering algorithms," IEEE Trans. Signal Processing, vol. 53, no. 4, pp. 1425-1438, April 2005. (Pubitemid 40535692)
6. P. L. Dragotti, M. Vetterli, and T. Blu, "Sampling moments and reconstructing signals of finite rate of innovation: Shannon meets Strang-Fix," IEEE Trans. Signal Processing, vol. 55, no. 5, pp. 1741-1757, May 2007.